In this paper, a new method based on the use of wavelet transformation prior to independent component analysis for solving the problem of defect detection in textile fabric images is presented. Different sub-bands of the wavelet packet tree scheme of the defect-free sub-windows are obtained and independent components of these subbands
are calculated as the basis vectors. The true feature vectors corresponding to these basis vectors are computed. The test sub-window is labeled as defective or not according to
the Euclidean distance between the true feature vector representing the non-defective regions and the feature vector of the sub-window under test. The advantage of adding wavelet analysis prior to independent component analysis is presented.
7th International Conference on Pattern Recognition and Image Analysis